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Lin, Chuan-Ju – Journal of Technology, Learning, and Assessment, 2010
Assembling equivalent test forms with minimal test overlap across forms is important in ensuring test security. Chen and Lei (2009) suggested a exposure control technique to control test overlap-ordered item pooling on the fly based on the essence that test overlap rate--ordered item pooling for the first t examinees is a function of test overlap…
Descriptors: Test Length, Test Format, Evaluation Criteria, Psychometrics