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Hambleton, Ronald K., Ed.; van der Linden, Wim J., Ed. – Applied Psychological Measurement, 1982
Item response theory (IRT) is having a major impact on the field of testing. This special issue presents an introduction and seven papers concerning developments in IRT applications. Some important IRT research being conducted outside the United States is highlighted. (SLD)
Descriptors: Adaptive Testing, Equated Scores, Item Analysis, Latent Trait Theory
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Hsu, Tse-chi; Nitko, Anthony J. – Educational Measurement: Issues and Practice, 1983
Microcomputer software for computer-assisted classroom testing is reviewed. The teacher and classroom are emphasized in applying computer technology. The major issues are identification of appropriate classroom testing microcomputer applications; identification of available microcomputer testing software; techniques for software evaluation; and…
Descriptors: Computer Assisted Testing, Computer Programs, Evaluation Methods, Grading
Nitko, Anthony J.; Hsu, Tse-chi – 1984
Item analysis procedures appropriate for domain-referenced classroom testing are described. A conceptual framework within which item statistics can be considered and promising statistics in light of this framework are presented. The sampling fluctuations of the more promising item statistics for sample sizes comparable to the typical classroom…
Descriptors: Computer Assisted Testing, Criterion Referenced Tests, Item Analysis, Microcomputers
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Hambleton, Ronald K. – Educational Measurement: Issues and Practice, 1984
The purpose of this paper is to describe some of the current changes in test development that are taking place because of the availability and capabilities of computers, especially microcomputers. Item banking and test assembly are discussed, and a comprehensive testing system is described. (BW)
Descriptors: Computer Assisted Testing, Computer Software, Educational Testing, Elementary Secondary Education
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Roeber, Edward D. – Educational Measurement: Issues and Practice, 1984
In every instance in the process of constructing and using a test, the microcomputer can aid the classroom teacher. However, the teacher will not apply the microcomputer to classroom testing without added training both in classroom testing and in using the microcomputer. (BW)
Descriptors: Computer Assisted Testing, Educational Testing, Elementary Secondary Education, Item Analysis
Madsen, Harold S. – 1986
The most appropriate statistical model for the small-scale (n<100) studies common in language testing research is the Rasch one-parameter logistic model. The Rasch model provides a wide range of options for conducting research, refining existing examinations, and developing tailored (computerized adaptive) language tests. Three investigations…
Descriptors: Computer Assisted Testing, Computer Software, English (Second Language), Item Analysis