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van der Linden, Wim J. – Applied Psychological Measurement, 1979
The restrictions on item difficulties that must be met when binomial models are applied to domain-referenced testing are examined. Both a deterministic and a stochastic conception of item responses are discussed with respect to difficulty and Guttman-type items. (Author/BH)
Descriptors: Difficulty Level, Item Sampling, Latent Trait Theory, Mathematical Models
Kriewall, Thomas E.; Hirsch, Edward – 1969
As an alternative to a classical test theory basis for criterion-referenced test construction, it is proposed that a strict item-sampling model be used. The computer's role in such a model is outlined. The assumptions of the model are carefully defined and its properties reviewed. The relationship between mastery criteria and such sampling plans…
Descriptors: Arithmetic, Behavioral Objectives, Computer Assisted Instruction, Criterion Referenced Tests