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Samejima, Fumiko – 1977
A method of estimating the operating characteristics of a new test item added to an established test without assuming a prior model has been proposed by the author. In this paper, the author extends this logic by proposing a different hypothesized distribution of the resulting estimate. The former method used a normal approximation; the present…
Descriptors: Adaptive Testing, Career Development, Correlation, Error of Measurement
Hambleton, Ronald K.; Cook, Linda L. – 1978
The purpose of the present research was to study, systematically, the "goodness-of-fit" of the one-, two-, and three-parameter logistic models. We studied, using computer-simulated test data, the effects of four variables: variation in item discrimination parameters, the average value of the pseudo-chance level parameters, test length,…
Descriptors: Career Development, Difficulty Level, Goodness of Fit, Item Analysis
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Cook, Linda L.; Hambleton, Ronald K. – 1978
Latent trait models may offer considerable potential for the improvement of educational measurement practices, but until recently, they have received only limited attention from measurement specialists. This paper provides a brief introduction to latent trait models, and provides test practitioners with a non-technical introduction to the…
Descriptors: Career Development, Criterion Referenced Tests, Difficulty Level, Item Analysis
Curry, Allen R.; And Others – 1978
The efficacy of employing subsets of items from a calibrated item pool to estimate the Rasch model person parameters was investigated. Specifically, the degree of invariance of Rasch model ability-parameter estimates was examined across differing collections of simulated items. The ability-parameter estimates were obtained from a simulation of…
Descriptors: Career Development, Difficulty Level, Equated Scores, Error of Measurement
Haladyna, Tom; Roid, Gale – 1976
Three approaches to the construction of achievement tests are compared: construct, operational, and empirical. The construct approach is based upon classical test theory and measures an abstract representation of the instructional objectives. The operational approach specifies instructional intent through instructional objectives, facet design,…
Descriptors: Academic Achievement, Achievement Tests, Career Development, Comparative Analysis