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Download full textFeng, Mingyu, Ed.; Käser, Tanja, Ed.; Talukdar, Partha, Ed. – International Educational Data Mining Society, 2023
The Indian Institute of Science is proud to host the fully in-person sixteenth iteration of the International Conference on Educational Data Mining (EDM) during July 11-14, 2023. EDM is the annual flagship conference of the International Educational Data Mining Society. The theme of this year's conference is "Educational data mining for…
Descriptors: Information Retrieval, Data Analysis, Computer Assisted Testing, Cheating
Direct linkLevy, Roy; Mislevy, Robert J. – International Journal of Testing, 2004
The challenges of modeling students' performance in computer-based interactive assessments include accounting for multiple aspects of knowledge and skill that arise in different situations and the conditional dependencies among multiple aspects of performance. This article describes a Bayesian approach to modeling and estimating cognitive models…
Descriptors: Computer Assisted Testing, Markov Processes, Computer Networks, Bayesian Statistics
