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Lozano, José H.; Revuelta, Javier – Educational and Psychological Measurement, 2023
The present paper introduces a general multidimensional model to measure individual differences in learning within a single administration of a test. Learning is assumed to result from practicing the operations involved in solving the items. The model accounts for the possibility that the ability to learn may manifest differently for correct and…
Descriptors: Bayesian Statistics, Learning Processes, Test Items, Item Analysis
Wang, Shiyu; Zhang, Susu; Douglas, Jeff; Culpepper, Steven – Measurement: Interdisciplinary Research and Perspectives, 2018
Analyzing students' growth remains an important topic in educational research. Most recently, Diagnostic Classification Models (DCMs) have been used to track skill acquisition in a longitudinal fashion, with the purpose to provide an estimate of students' learning trajectories in terms of the change of fine-grained skills overtime. Response time…
Descriptors: Reaction Time, Markov Processes, Computer Assisted Instruction, Spatial Ability
Feng, Mingyu, Ed.; Käser, Tanja, Ed.; Talukdar, Partha, Ed. – International Educational Data Mining Society, 2023
The Indian Institute of Science is proud to host the fully in-person sixteenth iteration of the International Conference on Educational Data Mining (EDM) during July 11-14, 2023. EDM is the annual flagship conference of the International Educational Data Mining Society. The theme of this year's conference is "Educational data mining for…
Descriptors: Information Retrieval, Data Analysis, Computer Assisted Testing, Cheating

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