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Download full textFeng, Mingyu, Ed.; Käser, Tanja, Ed.; Talukdar, Partha, Ed. – International Educational Data Mining Society, 2023
The Indian Institute of Science is proud to host the fully in-person sixteenth iteration of the International Conference on Educational Data Mining (EDM) during July 11-14, 2023. EDM is the annual flagship conference of the International Educational Data Mining Society. The theme of this year's conference is "Educational data mining for…
Descriptors: Information Retrieval, Data Analysis, Computer Assisted Testing, Cheating
Direct linkPanjaburee, Patcharin; Hwang, Gwo-Jen; Triampo, Wannapong; Shih, Bo-Ying – Computers & Education, 2010
With the popularization of computer and communication technologies, researchers have attempted to develop computer-assisted testing and diagnostic systems to help students improve their learning performance on the Internet. In developing a diagnostic system for detecting students' learning problems, it is difficult for individual teachers to…
Descriptors: Learning Problems, Test Items, Testing, Teaching Methods
