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Nitko, Anthony J.; Hsu, Tse-chi – 1984
Item analysis procedures appropriate for domain-referenced classroom testing are described. A conceptual framework within which item statistics can be considered and promising statistics in light of this framework are presented. The sampling fluctuations of the more promising item statistics for sample sizes comparable to the typical classroom…
Descriptors: Computer Assisted Testing, Criterion Referenced Tests, Item Analysis, Microcomputers
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Cobern, William W. – 1986
This computer program, written in BASIC, performs three different calculations of test reliability: (1) the Kuder-Richardson method; (2); the "common split-half" method; and (3) the Rulon-Guttman split-half method. The program reads sequential access data files for microcomputers that have been set up by statistical packages such as…
Descriptors: Computer Software, Difficulty Level, Educational Research, Equations (Mathematics)
Madsen, Harold S. – 1986
The most appropriate statistical model for the small-scale (n<100) studies common in language testing research is the Rasch one-parameter logistic model. The Rasch model provides a wide range of options for conducting research, refining existing examinations, and developing tailored (computerized adaptive) language tests. Three investigations…
Descriptors: Computer Assisted Testing, Computer Software, English (Second Language), Item Analysis
Thompson, Bruce; Levitov, Justin E. – Collegiate Microcomputer, 1985
Discusses features of a microcomputer program, SCOREIT, used at New Orleans' Loyola University and several high schools to score and analyze test results. Benefits and dimensions of the program's automated test and item analysis are outlined, and several examples illustrating test and item analyses by SCOREIT are presented. (MBR)
Descriptors: Computer Assisted Testing, Computer Software, Difficulty Level, Higher Education
Linacre, John M. – 1987
This paper describes a computer program in Microsoft BASIC which selects and administers test items from a small item bank. The level of the difficulty of the item selected depends on the test taker's previous response. This adaptive system is based on the Rasch model. The Rasch model uses a unit of measurement based on the logarithm of the…
Descriptors: Adaptive Testing, Computer Assisted Testing, Difficulty Level, Individual Testing
Switzer, Deborah M.; Connell, Michael L. – 1989
This paper describes teacher usage of the microcomputer programs Test Analysis Package (TAP) and Student Problem Package (SPP) to analyze students' test item responses. These methods of organizing, analyzing, and reporting test results have proven useful to classroom teachers. The TAP consists of four integrated microcomputer programs to edit,…
Descriptors: Academic Achievement, Computer Assisted Testing, Computer Managed Instruction, Computer Software
Wisniewski, Dennis R. – 1986
Three questions concerning the Binary Search Method (BSM) of computerized adaptive testing were studied: (1) whether it provided a reliable and valid estimation of examinee ability; (2) its effect on examinee attitudes toward computerized adaptive testing and conventional paper-and-pencil testing; and (3) the relationship between item response…
Descriptors: Adaptive Testing, Computer Assisted Testing, Difficulty Level, Grade 5