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Su, Shiyang; Wang, Chun; Weiss, David J. – Educational and Psychological Measurement, 2021
S-X[superscript 2] is a popular item fit index that is available in commercial software packages such as "flex"MIRT. However, no research has systematically examined the performance of S-X[superscript 2] for detecting item misfit within the context of the multidimensional graded response model (MGRM). The primary goal of this study was…
Descriptors: Statistics, Goodness of Fit, Test Items, Models
Wang, Chun – Journal of Educational and Behavioral Statistics, 2014
Many latent traits in social sciences display a hierarchical structure, such as intelligence, cognitive ability, or personality. Usually a second-order factor is linearly related to a group of first-order factors (also called domain abilities in cognitive ability measures), and the first-order factors directly govern the actual item responses.…
Descriptors: Measurement, Accuracy, Item Response Theory, Adaptive Testing
Wang, Chun; Chang, Hua-Hua; Boughton, Keith A. – Applied Psychological Measurement, 2013
Multidimensional computerized adaptive testing (MCAT) is able to provide a vector of ability estimates for each examinee, which could be used to provide a more informative profile of an examinee's performance. The current literature on MCAT focuses on the fixed-length tests, which can generate less accurate results for those examinees whose…
Descriptors: Computer Assisted Testing, Adaptive Testing, Test Length, Item Banks
Wang, Chun – Educational and Psychological Measurement, 2013
Cognitive diagnostic computerized adaptive testing (CD-CAT) purports to combine the strengths of both CAT and cognitive diagnosis. Cognitive diagnosis models aim at classifying examinees into the correct mastery profile group so as to pinpoint the strengths and weakness of each examinee whereas CAT algorithms choose items to determine those…
Descriptors: Computer Assisted Testing, Adaptive Testing, Cognitive Tests, Diagnostic Tests