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Liang, Tie; Wells, Craig S.; Hambleton, Ronald K. – Journal of Educational Measurement, 2014
As item response theory has been more widely applied, investigating the fit of a parametric model becomes an important part of the measurement process. There is a lack of promising solutions to the detection of model misfit in IRT. Douglas and Cohen introduced a general nonparametric approach, RISE (Root Integrated Squared Error), for detecting…
Descriptors: Item Response Theory, Measurement Techniques, Nonparametric Statistics, Models
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Wells, Craig S.; Cohen, Allan S.; Patton, Jeffrey – International Journal of Testing, 2009
A primary concern with testing differential item functioning (DIF) using a traditional point-null hypothesis is that a statistically significant result does not imply that the magnitude of DIF is of practical interest. Similarly, for a given sample size, a non-significant result does not allow the researcher to conclude the item is free of DIF. To…
Descriptors: Test Bias, Test Items, Statistical Analysis, Hypothesis Testing
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Liang, Tie; Wells, Craig S. – Educational and Psychological Measurement, 2009
Investigating the fit of a parametric model is an important part of the measurement process when implementing item response theory (IRT), but research examining it is limited. A general nonparametric approach for detecting model misfit, introduced by J. Douglas and A. S. Cohen (2001), has exhibited promising results for the two-parameter logistic…
Descriptors: Sample Size, Nonparametric Statistics, Item Response Theory, Goodness of Fit
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Wells, Craig S.; Bolt, Daniel M. – Applied Measurement in Education, 2008
Tests of model misfit are often performed to validate the use of a particular model in item response theory. Douglas and Cohen (2001) introduced a general nonparametric approach for detecting misfit under the two-parameter logistic model. However, the statistical properties of their approach, and empirical comparisons to other methods, have not…
Descriptors: Test Length, Test Items, Monte Carlo Methods, Nonparametric Statistics