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Huynh, Huynh – Journal of Educational Statistics, 1981
Simulated data based on five test score distributions indicate that a slight modification of the asymptotic normal theory for the estimation of the p and kappa indices in mastery testing will provide results which are in close agreement with those based on small samples from the beta-binomial distribution. (Author/BW)
Descriptors: Error of Measurement, Mastery Tests, Mathematical Models, Test Reliability
Peer reviewed Peer reviewed
Wilcox, Rand R. – Journal of Educational Statistics, 1981
Both the binomial and beta-binomial models are applied to various problems occurring in mental test theory. The paper reviews and critiques these models. The emphasis is on the extensions of the models that have been proposed in recent years, and that might not be familiar to many educators. (Author)
Descriptors: Error of Measurement, Item Analysis, Mathematical Models, Test Reliability
Peer reviewed Peer reviewed
Boodoo, Gwyneth M. – Journal of Educational Statistics, 1982
Incidence sampling is a parsimonious method whereby a large number of examinees can be measured on many variables (such as test items) to assess group characteristics. Parameters used to describe an incidence sample are estimated using the theory of generalized symmetric means and generalizability theory. (Author/JKS)
Descriptors: Analysis of Variance, Data Analysis, Error of Measurement, Measurement Techniques
Peer reviewed Peer reviewed
Huynh, Huynh – Journal of Educational Statistics, 1986
Under the assumptions of classical measurement theory and the condition of normality, a formula is derived for the reliability of composite scores. The formula represents an extension of the Spearman-Brown formula to the case of truncated data. (Author/JAZ)
Descriptors: Computer Simulation, Error of Measurement, Expectancy Tables, Scoring Formulas
Peer reviewed Peer reviewed
Morgan, Anne; Wainer, Howard – Journal of Educational Statistics, 1980
Two estimation procedures for the Rasch Model of test analysis are reviewed in detail, particularly with respect to new developments that make the more statistically rigorous conditional maximum likelihood estimation practical for use with longish tests. (Author/JKS)
Descriptors: Error of Measurement, Latent Trait Theory, Maximum Likelihood Statistics, Psychometrics