Publication Date
| In 2026 | 0 |
| Since 2025 | 0 |
| Since 2022 (last 5 years) | 0 |
| Since 2017 (last 10 years) | 0 |
| Since 2007 (last 20 years) | 1 |
Descriptor
| Adaptive Testing | 3 |
| Intelligence Tests | 3 |
| Test Reliability | 3 |
| Computer Assisted Testing | 2 |
| Elementary Secondary Education | 2 |
| Test Construction | 2 |
| Ability | 1 |
| Achievement Tests | 1 |
| Alphabets | 1 |
| Computer Assisted Instruction | 1 |
| Correlation | 1 |
| More ▼ | |
Publication Type
| Guides - General | 1 |
| Journal Articles | 1 |
| Numerical/Quantitative Data | 1 |
| Reports - Research | 1 |
| Speeches/Meeting Papers | 1 |
Education Level
| Elementary Secondary Education | 1 |
Audience
Location
| Florida | 1 |
Laws, Policies, & Programs
Assessments and Surveys
| Peabody Picture Vocabulary… | 1 |
| Stanford Achievement Tests | 1 |
| Stanford Binet Intelligence… | 1 |
What Works Clearinghouse Rating
Download full textFoorman, Barbara R.; Petscher, Yaacov; Schatschneider, Chris – Florida Center for Reading Research, 2015
The FAIR-FS consists of computer-adaptive reading comprehension and oral language screening tasks that provide measures to track growth over time, as well as a Probability of Literacy Success (PLS) linked to grade-level performance (i.e., the 40th percentile) on the reading comprehension subtest of the Stanford Achievement Test (SAT-10) in the…
Descriptors: Reading Instruction, Screening Tests, Reading Comprehension, Oral Language
Peer reviewedCudeck, Robert; And Others – Applied Psychological Measurement, 1980
Tailored testing by Cliff's method of implied orders was simulated through the use of responses gathered during conventional administration of the Stanford-Binet Intelligence Scale. Tailoring eliminated approximately half the responses with only modest decreases in score reliability. (Author/BW)
Descriptors: Adaptive Testing, Computer Assisted Testing, Elementary Secondary Education, Intelligence Tests
Reckase, Mark D. – 1974
An application of the two-paramenter logistic (Rasch) model to tailored testing is presented. The model is discussed along with the maximum likelihood estimation of the ability parameters given the response pattern and easiness parameter estimates for the items. The technique has been programmed for use with an interactive computer terminal. Use…
Descriptors: Ability, Adaptive Testing, Computer Assisted Instruction, Difficulty Level
