Finding and interpreting lower bounds for reliability coefficients for tests with non-homogeneous items has been a problem for psychometricians. A computer search procedure is developed for locating such a lower bound in a variety of settings. (Author/JKS)

Finding and interpreting lower bounds for reliability coefficients for tests with nonhomogenous items has been a problem for psychometricians. This paper presents a mathematical formula for finding the greatest lower bound for such a coefficient. (Author/JKS)

A procedure for estimating the reliability of a factorially complex composite is considered. An application of its use with Scholastic Aptitude Test data is provided. (Author/JKS)

Methods for estimating the mean and variance of latent ability parameters of a normally distributed population that has been tested with Rasch model-calibrated test items are discussed. Methods for checking the normality of the population are also included. (JKS)

The purposes of the present investigation were to illustrate the applicability of categorization methodology for several empirical situations and to draw implications regarding the use of such methodology in examining categorical data. In using three tasks--two designed to measure cognitive dimensions (e.g., categorizing countries and categorizing…

The problem of determining an optimal passing score for a mastery test is discussed, when the purpose of the test is to predict success on an external criterion. For the case of constant losses for the two possible error types, a method for determining passing scores is derived. (Author/JKS)

A debate concerning specific issues and the general usefulness of the Rasch latent trait test model is continued. Methods of estimation, necessary sample size, and the applicability of the model are discussed. (JKS)

It is shown that empirical mental test P - P plots are approximately equal to theoretical item-item curves, at least for long tests administered to many people. This result is important because it leads to (1) a distribution free method for estimating points on item-item curves; (2) a general method for defining estimates of item parameters; and…

Statements made in a previous article of this journal concerning the Rasch latent trait test model are questioned. Methods of estimation, necessary sample sizes, several formuli, and the general usefulness of the Rasch model are discussed. (JKS)

Using the assumption of randomly parallel tests and concepts from generalizability theory, three signal/noise ratios for domain-referenced tests are developed, discussed, and compared. The three ratios have the same noise but different signals depending upon the kind of decision to be made as a result of measurement. (Author/JKS)

This paper discusses standard error of measurement (SEM), the amount of variation or spread in the measurement errors for a test, and gives information needed to interpret test scores using SEMs. SEMs at various score levels should be used in calculating score bands rather than a single SEM value. (SLD)

A large number of seemingly diverse coefficients have been proposed as indices of dependability, or reliability, for domain-referenced and/or mastery tests. In this paper, it is shown that most of these indices are special cases of two generalized indices of agreement: one that is corrected for chance, and one that is not. The special cases of…

The Mastery-Learning test model is extended. Methods for estimating prior probabilities are described. The use of an adjustment matrix to transform a probability of mastery measure and empirical methods for estimating adjustment matrix parameters are derived. Adjustment matrices are interpreted as indicators of instructional effectiveness and as…

Reviewing psychometric and statistical developments in criterion- referenced testing, this paper presents six sections: uses of criterion- referenced test scores, reliability of criterion-referenced test scores, determination of test length, determination of cut-off scores, test development and validation, and summary and suggestions for further…