Peer reviewedERIC Number: EJ197233
Record Type: Journal
Publication Date: 1978-Sep
Pages: N/A
Abstractor: N/A
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Available Date: N/A
Reliability of Multiple Classifications.
Huynh, Huynh
Psychometrika, v43 n3 p317-25 Sep 1978
The use of Cohen's kappa index as a measure of the reliability of multiple classifications is developed. Special cases of the index as well as the effects of test length on the index are also explored. (JKS)
Descriptors: Career Development, Classification, Mastery Tests, Test Length, Test Reliability, Test Theory
Publication Type: Journal Articles
Education Level: N/A
Audience: N/A
Language: English
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Authoring Institution: N/A
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