Descriptor
Test Theory | 7 |
Achievement Tests | 4 |
Latent Trait Theory | 4 |
Equated Scores | 3 |
Mathematical Models | 3 |
Simulation | 3 |
Test Items | 3 |
Difficulty Level | 2 |
Goodness of Fit | 2 |
Item Analysis | 2 |
Psychometrics | 2 |
More ▼ |
Author
Yen, Wendy M. | 7 |
Bogan, Evelyn Doody | 1 |
Green, Donald Ross | 1 |
Publication Type
Reports - Research | 6 |
Speeches/Meeting Papers | 3 |
Journal Articles | 2 |
Reports - Evaluative | 1 |
Education Level
Audience
Researchers | 1 |
Location
Laws, Policies, & Programs
Assessments and Surveys
California Achievement Tests | 1 |
Comprehensive Tests of Basic… | 1 |
What Works Clearinghouse Rating

Yen, Wendy M. – Journal of Educational Measurement, 1986
Two methods of constucting equal-interval scales for educational achievement are discussed: Thurstone's absolute scaling method and Item Response Theory. Alternative criteria for choosing a scale are contrasted. It is argued that clearer criteria are needed for judging the appropriateness and usefulness of alternative scaling procedures.…
Descriptors: Achievement Tests, Latent Trait Theory, Mathematical Models, Scaling

Yen, Wendy M. – Psychometrika, 1983
Tau-equivalence means that two tests produce equal true scores for individuals but that the distribution of errors for the tests could be different. This paper examines the effect of performing equipercentile equating techniques on tau-equivalent tests. (JKS)
Descriptors: Equated Scores, Latent Trait Theory, Psychometrics, Scores
Yen, Wendy M. – 1982
Test scores that are not perfectly reliable cannot be strictly equated unless they are strictly parallel. This fact implies that tau equivalence can be lost if an equipercentile equating is applied to observed scores that are not strictly parallel. Thirty-six simulated data sets are produced to simulate equating tests with different difficulties…
Descriptors: Difficulty Level, Equated Scores, Latent Trait Theory, Methods
Bogan, Evelyn Doody; Yen, Wendy M. – 1983
Four multidimensional data configurations and one unidimensional data configuration were simulated for three differences in mean difficulty between two tests to be equated. Two chi-square statistics, Q1 and Q2, were examined for their ability to detect multidimensionality. Results indicated that Q1 did not discriminate between any of the…
Descriptors: Difficulty Level, Equated Scores, Goodness of Fit, Latent Trait Theory
Yen, Wendy M. – 1979
Three test-analysis models were used to analyze three types of simulated test score data plus the results of eight achievement tests. Chi-square goodness-of-fit statistics were used to evaluate the appropriateness of the models to the four kinds of data. Data were generated to simulate the responses of 1,000 students to 36 pseudo-items by…
Descriptors: Achievement Tests, Correlation, Goodness of Fit, Item Analysis
Green, Donald Ross; Yen, Wendy M. – 1984
Basic skills tests in which measurement of growth is defined in the context of national norms are discussed. An integral part of the construction of norms is the production of a trait or ability score which is normed. Test publishers define a multidimensional trait by including items which measure it. The trait as a construct is a distinct…
Descriptors: Achievement Gains, Achievement Tests, Basic Skills, Construct Validity
Yen, Wendy M. – 1979
The extent, causes, and importance of context effects on item parameters for one- and three-parameter latent-trait models were examined. Items were taken from the California Achievement Tests Reading Comprehension and Mathematics Concepts and Applications subtests. The reading items were administered to 1,678 fourth-grade students, and the…
Descriptors: Achievement Tests, Context Clues, Educational Testing, Elementary School Mathematics