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Polin, L.; Baker, E. L. – 1978
A neglected element in designing tests is that of publicness, that is, the extent to which test specifications are understandable and usable by all interested parties. Issues related to content validity, such as test bias and instructional sensitivity, become accessible to these parties once content validity and design have been adequately…
Descriptors: Rating Scales, Test Construction, Test Items, Test Selection

Beuchert, A. Kent; Mendoza, Jorge L. – Journal of Educational Measurement, 1979
Ten item discrimination indices, across a variety of item analysis situations, were compared, based on the validities of tests constructed by using each of the indices to select 40 items from a 100-item pool. Item score data were generated by a computer program and included a simulation of guessing. (Author/CTM)
Descriptors: Item Analysis, Simulation, Statistical Analysis, Test Construction
Zimmerman, Irla L.; Woo-Sam, James M. – 1982
Two kinds of WISC-R short forms, item reduction and subtest reduction, are reviewed in terms of their ability to meet these criteria of adequacy: a significant correlation between the full scale IQ and the short form IQ, a non-significant difference between the full and short form mean IQ, a low percentage of IQ classification changes resulting…
Descriptors: Intelligence Tests, Test Interpretation, Test Items, Test Reliability

Ebel, Robert L. – Journal of Educational Measurement, 1982
Reasonable and practical solutions to two major problems confronting the developer of any test of educational achievement (what to measure and how to measure it) are proposed, defended, and defined. (Author/PN)
Descriptors: Measurement Techniques, Objective Tests, Test Construction, Test Items
Bower, Ruth – Spectrum, 1983
As a preliminary step in customizing the Stanford Achievement Test, a study was made to compare the test items at each level with the curriculum objectives of a Florida school district, classifying them as either matching, above or below grade level, or unmatching. Results are shown in table form. (TE)
Descriptors: Elementary Secondary Education, Item Analysis, Standardized Tests, Statistical Data

Goh, David S. – Applied Psychological Measurement, 1979
The advantages of using psychometric thoery to design short forms of intelligence tests are demonstrated by comparing such usage to a systematic random procedure that has previously been used. The Wechsler Intelligence Scale for Children Revised (WISC-R) Short Form is presented as an example. (JKS)
Descriptors: Elementary Secondary Education, Intelligence Tests, Item Analysis, Psychometrics

Plake, Barbara S.; Hoover, H. D. – Journal of Educational Measurement, 1979
An experiment investigated the extent to which the results of out-of-level testing may be biased because the child given an out of level test may have had a significantly different curriculum than the children given in-level tests. Item analysis data suggested this was unlikely. (CTM)
Descriptors: Achievement Tests, Elementary Education, Elementary School Curriculum, Grade Equivalent Scores
New York State Div. for Youth, Albany. – 1985
This guide is designed to serve as a reference to assist providers of Job Training Partnership Act-funded programs in selecting appropriate interest, aptitude, and pre-employment and job readiness tests. Descriptions of 53 interest tests, 38 aptitude tests, and 37 pre-employment and job readiness tests are provided. Each description contains…
Descriptors: Aptitude Tests, Employment Potential, Evaluation Criteria, Guidelines
Baker, Eva L.; And Others – 1980
The materials presented were developed for use in a series of conferences on testing and instruction sponsored by the National Institute of Education, with the United States Office of Education, the UCLA Center for the Study of Evaluation, and a network of research and development agencies. They are intended for use by school practitioners and…
Descriptors: Criterion Referenced Tests, Elementary Secondary Education, Evaluation Criteria, Item Analysis