Descriptor
| Cutting Scores | 1 |
| Educational Testing | 1 |
| Mastery Tests | 1 |
| Mathematical Models | 1 |
| Measurement Techniques | 1 |
| Scoring Formulas | 1 |
| Test Construction | 1 |
| Test Length | 1 |
| Test Theory | 1 |
| Testing Problems | 1 |
Source
| Evaluation in Education:… | 1 |
Author
| van der Linden, Wim J. | 1 |
Publication Type
| Journal Articles | 1 |
| Reports - Evaluative | 1 |
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van der Linden, Wim J. – Evaluation in Education: International Progress, 1982
In mastery testing a linear relationship between an optimal passing score and test length is presented with a new optimization criterion. The usual indifference zone approach, a binomial error model, decision errors, and corrections for guessing are discussed. Related results in sequential testing and the latent class approach are included. (CM)
Descriptors: Cutting Scores, Educational Testing, Mastery Tests, Mathematical Models
