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Yarnold, Paul R. – Educational and Psychological Measurement, 1984
Unreliable profiles impose the difficulty that ordinal and interval relations among the individual's scores become uncertain or unstable. A profile reliability coefficient is derived to estimate the relative expected extent of this ordinal and interval "inversion" for any profile of K measures. (Author/DWH)
Descriptors: Error of Measurement, Mathematical Models, Profiles, Test Reliability

Zimmerman, Donald W.; And Others – Journal of Experimental Education, 1981
Reliability coefficients of linear combinations of observed scores have anomalous properties which have led to difficulties in the investigation of difference scores and gain scores in test theory. Discrepancies between classical results and correct results obtained from more general formulas, which allow for correlated errors, are examined…
Descriptors: Error of Measurement, Mathematical Formulas, Mathematical Models, Scores

Budescu, David – Journal of Educational Measurement, 1985
An important determinant of equating process efficiency is the correlation between the anchor test and components of each form. Use of some monotonic function of this correlation as a measure of equating efficiency is suggested. A model relating anchor test length and test reliability to this measure of efficiency is presented. (Author/DWH)
Descriptors: Correlation, Equated Scores, Mathematical Models, Standardized Tests
Wilcox, Rand R. – 1978
Two fundamental problems in mental test theory are to estimate true score and to estimate the amount of error when testing an examinee. In this report, three probability models which characterize a single test item in terms of a population of examinees are described. How these models may be modified to characterize a single examinee in terms of an…
Descriptors: Achievement Tests, Comparative Analysis, Error of Measurement, Mathematical Models
van der Linden, Wim J. – Evaluation in Education: International Progress, 1982
In mastery testing a linear relationship between an optimal passing score and test length is presented with a new optimization criterion. The usual indifference zone approach, a binomial error model, decision errors, and corrections for guessing are discussed. Related results in sequential testing and the latent class approach are included. (CM)
Descriptors: Cutting Scores, Educational Testing, Mastery Tests, Mathematical Models
Choppin, Bruce; And Others – 1982
A detailed description of five latent structure models of achievement measurement is presented. The first project paper, by David L. McArthur, analyzes the history of mental testing to show how conventional item analysis procedures were developed, and how dissatisfaction with them has led to fragmentation. The range of distinct conceptual and…
Descriptors: Academic Achievement, Achievement Tests, Comparative Analysis, Data Analysis
Wilcox, Rand R. – 1981
These studies in test adequacy focus on two problems: procedures for estimating reliability, and techniques for identifying ineffective distractors. Fourteen papers are presented on recent advances in measuring achievement (a response to Molenaar); "an extension of the Dirichlet-multinomial model that allows true score and guessing to be…
Descriptors: Achievement Tests, Criterion Referenced Tests, Guessing (Tests), Mathematical Models
Livingston, Samuel A. – 1986
This paper deals with test fairness regarding a test consisting of two parts: (1) a "common" section, taken by all students; and (2) a "variable" section, in which some students may answer a different set of questions from other students. For example, a test taken by several thousand students each year contains a common multiple-choice portion and…
Descriptors: Difficulty Level, Error of Measurement, Essay Tests, Mathematical Models
Quellmalz, Edys S.; Shaha, Steven – 1982
The potential of a cognitive model task analysis scheme (CMS) that specifies features of test problems shown by research to affect performance is explored. CMS describes the general skill area and the generic task or problem type. It elaborates features of the problem situation and required responses found by research to influence performance.…
Descriptors: Academic Achievement, Cognitive Measurement, Criterion Referenced Tests, Elementary Secondary Education
Cliff, Norman; And Others – 1978
The research from a four-year project of implied orders tailored testing is summarized. The method of implied orders testing combines the principles of ordinal measurement with the concept of the Guttman scale as an ideal. The basic principle for dichotomous items is that either an item is missed and "dominates" a person or it is answered…
Descriptors: Adaptive Testing, Career Development, Computer Assisted Testing, Group Testing
Levine, Michael V.; Drasgow, Fritz – 1984
Some examinees' test-taking behavior may be so idiosyncratic that their scores are not comparable to the scores of more typical examinees. Appropriateness indices, which provide quantitative measures of response-pattern atypicality, can be viewed as statistics for testing a null hypothesis of normal test-taking behavior against an alternative…
Descriptors: Cheating, College Entrance Examinations, Computer Simulation, Estimation (Mathematics)
Wainer, Howard; Kiely, Gerard L. – 1986
Recent experience with the Computerized Adaptive Test (CAT) has raised a number of concerns about its practical applications. The concerns are principally involved with the concept of having the computer construct the test from a precalibrated item pool, and substituting statistical characteristics for the test developer's skills. Problems with…
Descriptors: Adaptive Testing, Algorithms, Computer Assisted Testing, Construct Validity
Hambleton, Ronald K.; Rogers, H. Jane – 1986
This report was designed to respond to two major methodological shortcomings in the item bias literature: (1) misfitting test models; and (2) the use of significance tests. Specifically, the goals of the research were to describe a newly developed method known as the "plot method" for identifying potentially biased test items and to…
Descriptors: Criterion Referenced Tests, Culture Fair Tests, Difficulty Level, Estimation (Mathematics)