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van der Linden, Wim J. – Evaluation in Education: International Progress, 1982
In mastery testing a linear relationship between an optimal passing score and test length is presented with a new optimization criterion. The usual indifference zone approach, a binomial error model, decision errors, and corrections for guessing are discussed. Related results in sequential testing and the latent class approach are included. (CM)
Descriptors: Cutting Scores, Educational Testing, Mastery Tests, Mathematical Models
Peer reviewed Peer reviewed
Kafry, Ditsa; And Others – Applied Psychological Measurement, 1979
A series of behavioral expectation scale applications were analyzed in an attempt to point out an appropriate number of dimensions to be included in such studies. Results reflected the problems of dimension interdependence when the number of dimensions exceeds nine. (Author/JKS)
Descriptors: Behavior Rating Scales, Expectation, Factor Analysis, Higher Education
Peer reviewed Peer reviewed
Deville, Craig; O'Neill, Thomas; Wright, Benjamin D.; Woodcock, Richard W.; Munoz-Sandoval, Ana; Gershon, Richard C.; Bergstrom, Betty – Popular Measurement, 1998
Articles in this special section consider (1) flow in test taking (Craig Deville); (2) testwiseness (Thomas O'Neill); (3) test length (Benjamin Wright); (4) cross-language test equating (Richard W. Woodcock and Ana Munoz-Sandoval); (5) computer-assisted testing and testwiseness (Richard Gershon and Betty Bergstrom); and (6) Web-enhanced testing…
Descriptors: Computer Assisted Testing, Educational Testing, Equated Scores, Measurement Techniques
Davey, Tim; Pommerich, Mary; Thompson, Tony D. – 1999
In computerized adaptive testing (CAT), new or experimental items are frequently administered alongside operational tests to gather the pretest data needed to replenish and replace item pools. The two basic strategies used to combine pretest and operational items are embedding and appending. Variable-length CATs are preferred because of the…
Descriptors: Adaptive Testing, Computer Assisted Testing, Item Banks, Measurement Techniques