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Peer reviewed Peer reviewed
Werts, C. E.; And Others – Journal of Educational and Psychological Measurement, 1974
Descriptors: Analysis of Covariance, Analysis of Variance, Reliability, Statistical Analysis
Peer reviewed Peer reviewed
Werts, C. E.; And Others – Multivariate Behavioral Research, 1980
This paper demonstrates how the problem of calibrating measures can be formulated in terms of confirmatory factor analysis. The relationships between traditional approaches and a confirmatory factor approach are specified. (Author/CTM)
Descriptors: Achievement Tests, Equated Scores, Factor Analysis, Intermediate Grades
Peer reviewed Peer reviewed
Werts, C. E.; And Others – Educational and Psychological Measurement, 1980
Test-retest correlations can lead to biased reliability estimates when there is instability of true scores and/or when measurement errors are correlated. Using three administrations of the Test of Standard Written English and essay ratings, an analysis is demonstrated which separates true score instability and correlated errors. (Author/BW)
Descriptors: College Freshmen, Error of Measurement, Essay Tests, Higher Education
Werts, C. E.; And Others – 1972
Intraclass correlation reliability estimates are based on the assumption that the various measures are equivalent. Joreskog's (1970) general model for the analysis of covariance structures can be used to test the validity of this assumption. (For related document, see TM 002 301.) (Author)
Descriptors: Analysis of Covariance, Correlation, Hypothesis Testing, Mathematical Models
Peer reviewed Peer reviewed
Werts, C. E.; And Others – Educational and Psychological Measurement, 1976
A procedure is presented for the analysis of rating data with correlated intrajudge and uncorrelated interjudge measurement errors. Correlations between true scores on different rating dimensions, reliabilities for each judge on each dimension and correlations between intrajudge errors can be estimated given a minimum of three raters and two…
Descriptors: Correlation, Data Analysis, Error of Measurement, Error Patterns