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Direct linkLewis, Jennifer; Lim, Hwanggyu; Padellaro, Frank; Sireci, Stephen G.; Zenisky, April L. – Educational Measurement: Issues and Practice, 2022
Setting cut scores on (MSTs) is difficult, particularly when the test spans several grade levels, and the selection of items from MST panels must reflect the operational test specifications. In this study, we describe, illustrate, and evaluate three methods for mapping panelists' Angoff ratings into cut scores on the scale underlying an MST. The…
Descriptors: Cutting Scores, Adaptive Testing, Test Items, Item Analysis
